Meaning
Optical measurement technique utilizes light wave interference to produce high-resolution three-dimensional maps of surface topography. White-light profilometry determines the surface roughness and flatness of electrode foils and solid electrolyte ceramic sheets. This non-contact method provides precise surface metrics without risking the deformation of delicate or soft materials.
This capability is particularly critical for evaluating the surface quality of solid-state electrolyte sheets, where minor height variations can cause significant gaps or high-pressure points when assembled into a cell stack.
Measurement Process
Light from a broad-spectrum source passes through an interferometer that splits the beam into a reference path and a sample path. The reflected beams recombine to create interference fringes that are analyzed to calculate the surface height at each point. This technique delivers sub-nanometer vertical resolution.
Quality Control
Sourcing high-quality raw materials requires rigorous surface analysis to ensure uniform adhesion of the electrode active slurry. High surface roughness can lead to localized thin spots in the applied coating. This coating variation causes non-uniform current density during cell operation.
Instrument Application
Manufacturers use these profilometers to inspect the wear patterns of coating dies and compression rollers used in the calender line. Identifying microstructural changes early prevents the production of out-of-specification electrode batches. Reliable coating processes depend on this precision inspection.
