Meaning
Optical non-contact measurement methods analyze light wave interference patterns to map three-dimensional surface topographies with sub-nanometer vertical resolution. This analytical technique, called white light interferometry, combines a broad-spectrum light source with an optical microscope to generate detailed surface maps. It evaluates the flatness and roughness of current collector foils and sealing surfaces.
Method Function
Light from a single source is split into a reference beam and a measurement beam reflecting from the sample. Recombining these beams creates interference fringes that correspond to precise surface heights.
Quality Testing
Non-contact scanning prevents damage to delicate or soft materials like raw polymer membranes and thin copper foils. It allows rapid quality inspection of critical contact areas on battery terminal plates.
Sourcing Inspection
Procurement teams utilize this measurement method to verify the surface quality of high-precision materials from suppliers. It provides defensible, high-resolution data to resolve quality disputes regarding surface finishes.
