Meaning
Non destructive metrology technique detects surface defects by capturing only the light scattered by irregularities rather than the direct reflection from a sample. Dark field optical inspection identifies contaminants or pits on electrode foils and separator films that remain invisible under standard bright field lighting. This method ceases to be effective when the surface roughness of the material is so high that background noise overwhelms the scattered light from the defects.
Lighting configurations are typically adjusted based on the refractive index of the material being scanned.
Detection Mechanism
Illumination arrives at the surface from an oblique angle that falls outside the aperture of the objective lens. When dark field optical inspection is performed, only the light diverted by surface features enters the camera. This creates an image where the defects appear as bright spots against a black background.
Surface Analysis
Minute particles and shallow abrasions are highlighted with high contrast. Because dark field optical inspection does not depend on the color or reflectivity of the bulk material, it is used to scan both metallic foils and polymer membranes.
Quality Verification
Automated systems integrate this technique into high speed roll to roll manufacturing lines. Processing software calculates the size and location of every identified flaw. Consistent use of dark field optical inspection ensures that only defect free substrates proceed to the coating stage.
Failure to identify these flaws can lead to internal shorts in the finished battery cell.